Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Veeco FPP 5000 Four Point, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | FPP 5000 Four PointVeeco | |
|---|---|---|
| OEM | Tenney | Veeco |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Veeco FPP 5000 Four Point |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Veeco[2] |
| Model | JR-A-F4T[1] | FPP 5000 Four Point[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | With various types of holders[2] |
| Equipment type | — | Test & Probe[3] |
| Tool description | — | four point probe with various types of holders[3] |
| Test unit designation | — | VEECO FPP-5000 4-Point Probe test unit[4] |
| Measured items | — | resistive properties of semiconductor wafers and resistive films[5] |
| Measurement modes | — | V/I, SHEET, SLICE, THICK, TYPE, PEN[4] |
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