Waferpedia

Comparison ledger

Axioplan2 versus O Inspect 322 CMM

Zeiss Axioplan2 and Zeiss O Inspect 322 CMM, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMZeissZeiss
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyZeiss Axioplan2Zeiss O Inspect 322 CMM
Cited variants
  • O-INSPECT 3 / 2 / 2[1]
Specifications
ManufacturerZeiss[2]
ModelAxioplan2[2]
Listed asLinewidth2 Zeiss Axioplan2 Measuring System[2]
ConfigurationMeasuring volume X = 300 mm, Y = 200 mm, Z = 200 mm[3]
P/N636520-9932-000[1]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]nanolab.berkeley.edunanolab.berkeley.edu
  3. [3]inventory listing