Waferpedia

Comparison ledger

Merlin versus Supra 55 VP

Zeiss Merlin and Zeiss Supra 55 VP, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
MerlinZeiss
OEMZeissZeiss
CategoryMetrology & InspectionMetrology & Inspection
Wafer size4"
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyZeiss MerlinZeiss Supra 55
Specifications
Instrument typeScanning electron microscope (SEM)[1]
ColumnGEMINI II[1]
Stage5-axis motorized stage (X, Y, Z, Tilt and Rotation)[1]
LoadlockSemi-automatic airlock[1]
Control softwareZeissSmartSEM[1]
Available holdersmono samples, cleaved samples, and full 4 inch wafer[1]
DetectorsIn-Lens, HE-SE2, EsB, and EDX detector[1]
Windows OSW10[2]
SoftwareSmartSEM (v6)[2]
Source TypeTFE[2]
ConfigurationVariable pressure[2]
Primary pumpturbo[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]inventory listing