Waferpedia

Comparison ledger

O Inspect 322 CMM versus Sigma 300 VP FE-SEM

Zeiss O Inspect 322 CMM and Zeiss Sigma 300 VP FE-SEM, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMZeissZeiss
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyZeiss O Inspect 322 CMMZeiss Sigma
Cited variants
  • O-INSPECT 3 / 2 / 2[1]
Specifications
ConfigurationMeasuring volume X = 300 mm, Y = 200 mm, Z = 200 mm[2]50/60 Hz[3]
P/N636520-9932-000[1]
1/N/PE230 Vac[3]
2/PE208 Vac[3]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (3)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]inventory listing
  3. [3]inventory listing