Waferpedia

Comparison ledger

O Inspect 322 CMM versus Supra 55 VP

Zeiss O Inspect 322 CMM and Zeiss Supra 55 VP, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMZeissZeiss
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyZeiss O Inspect 322 CMMZeiss Supra 55
Cited variants
  • O-INSPECT 3 / 2 / 2[1]
Specifications
ConfigurationMeasuring volume X = 300 mm, Y = 200 mm, Z = 200 mm[2]Variable pressure[3]
P/N636520-9932-000[1]
Windows OSW10[3]
SoftwareSmartSEM (v6)[3]
Source TypeTFE[3]
Primary pumpturbo[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]inventory listing
  3. [3]inventory listing