Comparison ledger
Zeiss sem2 and Zeiss Sigma HDVP, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | sem2Zeiss | Sigma HDVPZeiss |
|---|---|---|
| OEM | Zeiss | Zeiss |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | 200mm | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Zeiss sem2 | Zeiss Sigma |
| Specifications | ||
| OEM | Zeiss[1] | — |
| Model | sem2[1] | — |
| Equipment name | Zeiss 200 mm Scanning Electron Microscope[1] | — |
| Acceleration voltage | — | 0.02 kV - 30 kV[2] |
| Magnification range | — | 10-1.000.000x[2] |
| Configuration | — | Electron source[2] |
| Specimen chamber | — | 358 mm[2] |
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