Comparison ledger
Advantest HP / Verigy PS 1600 Smartscale, Teradyne J 750, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | HP / Verigy PS 1600 SmartscaleAdvantest | J 750Teradyne |
|---|---|---|
| OEM | Advantest | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | 2012 Vintage year | — |
| Control system | — | Windows XP SP3 |
| Generation | — | — |
| Family | Advantest HP / Verigy PS 1600 | Teradyne J 750 |
| Specifications | ||
| Configuration | PS 1600 B (x2)[1] | 512 Pins[3] |
| Make | Advantest / Agilent / HP / Verigy[1] | Teradyne[3] |
| Model | PS 1600[1] | J 750[3] |
| Component: PS 1600 | 2[1] | — |
| Component: DPS 32 | 2[1] | — |
| Component: CTH (Compact Test Head) | 1[1] | — |
| Component: HP Z620 workstation | 1[1] | — |
| Component: RFE-A | 2[1] | — |
| Component: RFF-A | 2[1] | — |
| Vintage | 2012[2] | — |
| Category | Test & Probe[2] | — |
| Type | semiconductor test system[2] | — |
| Included components | PS 1600 modules, DPS 32 units, Compact Test Head (CTH), HP Z620 workstation, RFE-A modules, RFF-A modules[2] | — |
| Board | — | Channel[3] |
| PN | — | 239-001-04 1 ed 182 0945-D 5445[3] |
| Computer OS Version | — | Windows XP SP3[4] |
| IG-XL Version | — | 3.50.40[4] |
| Phase | — | 3 Phase[5] |
| Voltage | — | 208 VAC, 30 A, 50/60 Hz[8] |
| Borad | — | CUB[3] |
| Pin count | — | 512 pins[3] |
| Electrical input | — | 3 Phase - 3 Wire + PE - 50/60 Hz - 30 A, 208 Vac[5] |
| Application context | — | wafer-form integrated circuit testing[9] |
| Probe-station docking | — | A-type configuration[9] |
| Software version | — | IG-XL Version 3.50.40[4] |
| Power | — | 3 Phase - 3 Wire + PE - 50/60 Hz - 30 A, 208 Vac[5] |
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