Teradyne
J 750
Plate 01Test Program Generation for J750 CC - PC Screen capture.
KF KwokWatch on YouTube
Power
3 Phase[3]
Control era
Windows XP SP3
What it is
General reference — not yet source-verifiedThis class of equipment is used to apply controlled electrical stimuli to an integrated circuit and measure its responses so that parts can be sorted, verified, or qualified against test limits before later assembly or shipment.
How it works
General reference — not yet source-verifiedA semiconductor tester of this class connects to the device under test through many parallel channels, drives vectors or electrical conditions, and records the resulting responses to determine whether the part meets specification.
What do the numbers mean?
Vintage & configurations
Control-system eraWindows XP SP3[1]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest HP / Verigy PS 1600 Smartscale— Same function class: Test & Probe, UnknownCompare in depthsource[15]
- Advantest HP / Verigy PS 3600 Pinscale— Same function class: Test & Probe, UnknownCompare in depthsource[16]
- Advantest 93000— Same function class: Test & Probe, UnknownCompare in depthsource[17]
- Advantest V 93000— Same function class: Test & Probe, UnknownCompare in depthsource[18]
- LTX-Credence TMT ASL 1000 165— Same function class: Test & Probe, UnknownCompare in depthsource[19]
- Eagle ETS 200 T— Same function class: Test & Probe, UnknownCompare in depthsource[20]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- Teradyne J 750 ICUD BoardIn Productionsource[21]
- Teradyne J 750 HSD 800 BoardIn Productionsource[22]
- Teradyne J 750 DPS BoardIn Productionsource[23]
- Teradyne J 750 DPS BoardIn Productionsource[24]
- Teradyne J 750 BoardIn Productionsource[25]
- Teradyne J 750 DSMTO (HSD 200) 239-701-00 BoardIn Productionsource[26]
- Teradyne J 750 DSIO BoardIn Productionsource[27]
- Teradyne J 750 BoardIn Productionsource[28]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What does a test and probe system do in semiconductor manufacturing?General reference — not yet source-verified
It brings test contacts to the device under test and runs electrical measurements to determine whether the device meets required limits.
Why is this class used before final assembly?General reference — not yet source-verified
It allows manufacturers to detect defective devices early, reducing the chance that nonconforming parts move into later process stages.
What kinds of results does the system produce?General reference — not yet source-verified
It typically produces pass or fail decisions, along with measurement data used for sorting and device characterization.
What is the main function of the probe part of the system?General reference — not yet source-verified
The probe interface creates a controlled electrical connection to the device so that test signals can be applied and measured.
Not publicly documented
The following facts about the J 750 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the J 750 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
No publicly documented failure modes or field errata for the J 750 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the J 750 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (30)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
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- [10]Inventory photo
- [11]Inventory photo
- [12]Inventory photo
- [13]inventory listing
- [14]inventory listing
- [15]Equipment inventory listing
- [16]Equipment inventory listing
- [17]Equipment inventory listing
- [18]Equipment inventory listing
- [19]Equipment inventory listing
- [20]Equipment inventory listing
- [21]Equipment inventory listing
- [22]Equipment inventory listing
- [23]Equipment inventory listing
- [24]Equipment inventory listing
- [25]Equipment inventory listing
- [26]Equipment inventory listing
- [27]Equipment inventory listing
- [28]Equipment inventory listing
- [29]Equipment inventory listing
- [30]Teradyne - Divisions Contact Information — teradyne.com (Feb 10, 2014)web.archive.org
Last updated Jul 29, 2026.
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