Comparison ledger
Advantest M 6751 A, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 6751 AAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest M 6751 | KLA 1007 |
| Specifications | ||
| Configuration | parts machines[1] | — |
| Handler Type | Dynamic test handler[2] | — |
| Y2K Readiness Software Revision | 1.00[2] | — |
| Y2K Software Revision | 1.00[2] | — |
| Manufacturer | Advantest[3] | KLA[4] |
| Model | M 6751 A[3] | 1007[4] |
| Equipment type | Handler[3] | Prober[5] |
| Category listing | Dynamic Test Handlers[2] | — |
| Year 2000 readiness | Year 2000 ready from 1.00[2] | — |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
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