Comparison ledger
Advantest T 5593, Rorze 03 RR 8120-001-001 Wafer Exchanger, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5593Advantest | |
|---|---|---|
| OEM | Advantest | Rorze |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5593 | Rorze 03 RR 8120-001-001 Wafer Exchanger |
| Specifications | ||
| Configuration | 1 Test Head[1] | — |
| Ampere Rating of Largest Motor | 17 A[2] | — |
| Device Types | DDR2 SDRAM, High-speed SRAM[3] | — |
| Maximum Devices per System | 256 (128 x 2 stations for x8/x9 bit)[3] | — |
| Test Speed | 533 MHz / 1.066 GHz (DDR mode)[3] | — |
| Test Heads | 1[1] | — |
| Parallel Measurement Bits (Configuration) | 128 Para MB (KH7-010063/064) or 64 Para MB (KH7-010037/038)[1] | — |
| Power Supply Frequency | 50/60 Hz[2] | — |
| Calibration Board Vintage | 2007[2] | — |
| Wafer size | — | 8 inch[4] |
| Manufacturer | — | Rorze[4] |
| Model | — | 03 RR 8120-001-001[4] |
| Equipment type | — | Wafer Exchanger[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →