Advantest
T 5593
What it is
The Advantest T 5593 is an automated test equipment (ATE) system designed for memory device testing. The T 5593 is classified as a memory ATE. Like many at-speed memory testers, the T 5593 is capable of testing DDR2 SDRAM and high-speed SRAM. The system can handle up to two hundred fifty-six devices simultaneously.[7][1][9][8]
What do the numbers mean?
Power & electrical3
- 50/60 Hz[1]
Configuration & options10
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What types of memory devices can the T 5593 test?
The T 5593 is designed for testing DDR2 SDRAM and high-speed SRAM memory devices.[8]
Not publicly documented
The following facts about the T 5593 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 5593 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T 5593 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T 5593 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T 5593 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T 5593 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (9)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]Inventory photo
- [7]inventory listing
- [8]web.archive.org — advantest.co.jp (Jun 13, 2008)web.archive.org
- [9]Semiconductor Test | Memory ATE | Advantest T5593 — team-ate.comteam-ate.com
Last updated Aug 20, 2026.
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