Comparison ledger
Agilent 3325 A Function, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 3325 A FunctionAgilent | 1007KLA |
|---|---|---|
| OEM | Agilent | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 33xx | KLA 1007 |
| Specifications | ||
| Line | 50/60 Hz[1] | — |
| Voltage | 100/120/220/240 V[1] | — |
| Current | 450 Va Max[1] | — |
| Configuration | Option 2[1] | — |
| Manufacturer | Agilent[1] | KLA[4] |
| Model | 3325 A[1] | 1007[4] |
| Tool type | Function generator[2] | — |
| Category | Test & Probe[2] | — |
| Option | Option 2[1] | — |
| Publication year of manual | 1984[3] | — |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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