Comparison ledger
Bruker Dimension Icon, KLA 0035235-003 MMD Head, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Dimension IconBruker | |
|---|---|---|
| OEM | Bruker | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Bruker Dimension Icon | KLA 0035235-003 MMD Head |
| Cited variants |
| — |
| Specifications | ||
| XYZ Scan Range | 90 μm x 90 μm x 10 μm (typical)[2] | — |
| Maximum Imaging Area | 100 μm x 100 μm[3] | — |
| Maximum Feature Height | 2 μm[3] | — |
| Z-Axis Noise | Sub-angstrom range[4] | — |
| XY Noise | Angstroms[4] | — |
| Drift Rate | <200 pm[4] | — |
| Sample Diameter (Max) | 210 mm[2] | — |
| Sample Thickness (Max) | 15 mm[2] | — |
| Optics | 5-Megapixel digital camera; 180–1465 μm viewing area[2] | — |
| Controller | NanoScope 6[4] | — |
| Software | ScanAsyst Plus[4] | — |
| Instrument type | Atomic Force Microscope (AFM)[5] | — |
| Model | Dimension Icon[5] | 0035235-003[6] |
| OEM | Bruker / Veeco[5] | — |
| Platform description | World's highest performance large-sample AFM[4] | — |
| Scan range | 90 micrometers x 90 micrometers x 10 micrometers typical[2] | — |
| Sample size capacity | 210 mm diameter; 15 mm thick[2] | — |
| Microscope optics | 5-megapixel digital camera; 180–1465 micrometers viewing area[2] | — |
| Imaging software | ScanAsyst Plus self-optimizing imaging software[4] | — |
| Drift | <200 pm drift rates[4] | — |
| Configuration | — | TSTD PCB ASSY, MMD MEAS HEAD[6] |
| Make | — | KLA[6] |
| Part Description | — | TSTD PCB ASSY, MMD MEAS HEAD[6] |
| Compatible System | — | KLA AIT-XP[6] |
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