KLA
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The KLA 0035235-003 MMD Head is a TSTD PCB ASSY, MMD MEAS HEAD. The KLA 0035235-003 MMD Head is compatible with the KLA AIT-XP.[1]
A metrology and inspection head is a sensing assembly that acquires measurement data from wafers or other semiconductor process targets. The head is part of the measurement path in an inspection or metrology tool, where it helps gather information needed for process control and defect evaluation.
A measurement head in this class typically operates as part of a larger instrument that positions the sample, directs measurement energy or probes at the target, and converts the returned response into electrical signals for analysis. The head itself is usually one functional element within that measurement chain.
Metrology and inspection equipment is used during semiconductor fabrication to verify process results and detect abnormalities before downstream processing continues. A measurement head belongs in the inspection and measurement portion of the flow rather than in deposition, lithography, or etch.
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The following facts about the 0035235-003 MMD Head are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 0035235-003 MMD Head are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 0035235-003 MMD Head are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 0035235-003 MMD Head are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 0035235-003 MMD Head are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 0035235-003 MMD Head is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Aug 14, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA 1.112 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 inspection systems.