Waferpedia

Comparison ledger

VHX-7000versus.496 PSL Wafer

Keyence VHX-7000, KLA .496 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
VHX-7000Keyence
OEMKeyenceKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size8-inch wafers—
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones2026 End of life—
Control system——
Generation——
FamilyKeyence VHX-7000KLA .496 PSL Wafer
Specifications
Product typeDigital microscope[1]—
Magnification20× to 2500×[1]—
Illumination modesBrightfield and darkfield[1]—
Stage typeFully motorised 300 mm XY stage[1]—
FocusingAutomatic[1]—
Image acquisitionHigh-resolution[1]—
Magnification range20× to 2500×[1]—
IlluminationBrightfield and darkfield illumination[1]—
StageFully motorised 300 mm XY stage[1]—
ImagingHigh-resolution image acquisition[1]—
Image stitchingImage stitching for large samples[1]—
Depth imagingExtended depth-of-field imaging[1]—
Measurements2D measurements: distance, angle, area[1]—
3D capability3D surface reconstruction[1]—
DocumentationImage comparison and documentation[1]—
Wafer sizeUp to 8-inch wafers[1]8 inch[6]
Resolution4K resolution[2]—
Depth-of-field20x greater depth-of-field[2]—
AutomationFully automatic XYZ system[2]—
System typeFully-automated digital microscope system[4]—
TypeFully motorised digital microscope[1]—
Inspection sample sizeUp to 8-inch wafers[1]—
XY stageFully motorised 300 mm XY stage[1]—
3D functions3D surface reconstruction[1]—
Model statusThis model has been discontinued[5]—
Camera image sensor option 11/1.8 inch, 3.19 megapixel CMOS image sensor[5]—
Camera image sensor option 21/1.7-inch, 12.22-megapixel CMOS image sensor[5]—
Storage capacity1 TB[5]—
Power supply100 to 240 VAC ±10%, 50/60 Hz[5]—
Power consumption430 VA[5]—
Configuration—NIST Traceable[6]
Traceability—NIST Traceable[6]
Compatible systems—Capable on Surfscan 6xy0 and SP1[6]
Category—Metrology & Inspection[7]

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Sources (7)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]keyence.comkeyence.com
  3. [3]keyence.eukeyence.eu
  4. [4]ami.ua.eduami.ua.edu
  5. [5]keyence.comkeyence.com
  6. [6]inventory listing
  7. [7]waferpedia.comwaferpedia.com