Comparison ledger
Keysight M 8196 A Arbitrary Waveform, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 8196 A Arbitrary WaveformKeysight | 1007KLA |
|---|---|---|
| OEM | Keysight | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight M 8196 A Arbitrary Waveform | KLA 1007 |
| Specifications | ||
| Configuration | 92Gsa/S, Dual Channel[1] | — |
| Instrument type | Arbitrary waveform generator[2] | — |
| Sample rate | Up to 92 GSa/s[3] | — |
| Analog bandwidth | 32 GHz typical[3] | — |
| Vertical resolution | 8 bits[3] | — |
| Waveform memory | 512 kSa per channel[3] | — |
| Channel count | 1, 2, or 4 differential channels per 1-slot AXIe module[3] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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