Comparison ledger
KLA 1007, Multitest 9510, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | 9510Multitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | 2001– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest 9510 |
| Cited variants | — | |
| Specifications | ||
| Manufacturer | KLA[3] | — |
| Model | 1007[3] | — |
| Description | Wafer Prober[3] | — |
| Wafer size | 150 mm[3] | — |
| Convertible to 8 inch wafer size | Yes[3] | — |
| Vintage | 01.06.1995[3] | — |
| Make | KLA[4] | — |
| Equipment type | Prober[4] | Test handler family[2] |
| Configuration | — | Has a lot of change kits[5] |
| Application | — | Semiconductor test and probe[2] |
| Parallelism | — | Up to x16 test site parallelism[2] |
| Temperature range | — | -55°C to +150°C[1] |
| Variant | — | Tri-temp and pick-and-place variants[2] |
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