Comparison ledger
KLA 1007, Multitest MT 9510, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | MT 9510Multitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | 2001 |
| Production run | — | 2001– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest MT 9510 |
| Cited variants | — | |
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | — |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| Configuration | — | VC1/10S3E BGA[4] |
| Max temp | — | 175*C[8] |
| System | — | STD[9] |
| Temperature Range | — | -40/ 155[9] |
| Installed Kit | — | TQFP 7x7[9] |
| parallelism | — | Up to x16 test site parallelism[13] |
| temperature range | — | -55°C to +150°C[13] |
| throughput | — | Up to 5,300 UPH[14] |
| package support | — | QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC, PGA, LGA, MLP/MLF[14] |
| package size | — | 3 x 3 mm to 70 x 70 mm[14] |
| index time | — | 0.38 seconds (XP) and 0.65 seconds (x16)[14] |
| footprint | — | 1.19 m x 1.57 m (47 in x 62 in)[14] |
| weight | — | 850 kg (1,900 lbs)[15] |
| device size | — | 3 mm x 3 mm to 14 mm x 14 mm (for up to 8 contact sites)[15] |
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