Comparison ledger
KLA 1007, Teradyne Nextest Magnum II X GV, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Nextest Magnum II X GVTeradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne Nextest Magnum |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Test head | — | 8 Chassis[3] |
| Configuration | — | HSB 3 (qty 16)[3] |
| DBM Size | — | 18(2) GBIT[3] |
| ECRM Size | — | 72(4) GBIT[3] |
| RCM Size | — | 36(2) Mbit[3] |
| HSB 3 | — | qty 16[3] |
| PE 63 | — | qty 64[3] |
| DP3X | — | qty 64[3] |
| IPC | — | qty 4[3] |
| DPO | — | qty 4[3] |
| Total Channels | — | 4096[3] |
| Tester Computer | — | Dell T3500[3] |
| Operating System | — | Windows Server 2003[3] |
| Type | — | semiconductor tester[4] |
| Use | — | semiconductor test and probe operations[4] |
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