Comparison ledger
KLA .204 PSL Wafer, Leica Microsystems Polylite 88, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Leica |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | Leica Microsystems Polylite 88 |
| Specifications | ||
| Configuration | NIST Traceable[1] | 100-240 V[4] |
| Wafer Size | 8 inch[2] | — |
| Traceability | NIST[3] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[2] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[2] | — |
| Power | — | 100 W[4] |
| Equipment type | — | Microscope[5] |
| Electrical input | — | 100-240 V, 47-63 Hz[4] |
| Description | — | Microscope, Leica AG Reichert Division Type302303[6] |
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