Comparison ledger
KLA .204 PSL Wafer, Olympus SZ6045TR, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | SZ6045TROlympus | |
|---|---|---|
| OEM | KLA | Olympus |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | Olympus SZ6045TR |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[2] | — |
| Traceability | NIST[3] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[2] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[2] | — |
| OEM | — | Olympus[4] |
| Model | — | SZ6045TR[4] |
| Category | — | Binocular microscope[4] |
| Location | — | Z17[4] |
| Equipment type | — | Zoom stereo microscope[5] |
| Zoom ratio | — | 6.3[5] |
| Working distance | — | 100 mm[5] |
| Classification in facility inventory | — | Binocular microscope[4] |
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