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Comparison ledger

.204 PSL WaferversusScientific FEI Strata 400 S STEM

KLA .204 PSL Wafer, Thermo Fisher Scientific FEI Strata 400 S STEM, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
OEMKLAThermo Fisher
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .204 PSL WaferThermo Fisher Scientific FEI Strata 400 S
Specifications
ConfigurationNIST Traceable[1]Type FP 2045/31[4]
Wafer Size8 inch[2]—
TraceabilityNIST[3]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[2]—
Compatible toolsSurfscan 6xy0 and Sp1 particle counters[2]—
UHV Assy—51-1236-207 +24V = 50W[4]
Resolution at 5.9 keV—127eV[4]
Instrument type—Scanning transmission electron microscope[5]
Category—Metrology & Inspection[5]
Power / electrical—UHV Assy 51-1236-207 +24V = 50W[5]
Optics / imaging—Resolution at 5.9 keV: 127eV[5]
Configuration / type—Type FP 2045/31[5]
Included spectroscopy—Oxford 51-XMX 1134 X-Max Energy Dispersive X-ray Spectroscopy[5]
Type—FP 2045/31[5]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing
  5. [5]waferpedia.comwaferpedia.com