Comparison ledger
KLA .204 PSL Wafer, YES YTV F 1 AOI, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | YTV F 1 AOIYES | |
|---|---|---|
| OEM | KLA | YES |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | YES YTV F 1 AOI |
| Specifications | ||
| Configuration | NIST Traceable[1] | — |
| Wafer Size | 8 inch[2] | — |
| Traceability | NIST[3] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[2] | — |
| Compatible tools | Surfscan 6xy0 and Sp1 particle counters[2] | — |
| Category | — | Metrology & Inspection[4] |
| Machine type | — | Automated Optical Inspection (AOI)[5] |
| Camera type | — | Top down viewing camera[6] |
| Max board size | — | 22" x 20"[6] |
| Resolution | — | 1280 x 1025[6] |
| Electrical input | — | 120VAC 1500W Max[6] |
| Serial number | — | V309071067[6] |
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