Comparison ledger
KLA .496 PSL Wafer, Nordson Quadra 3, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Quadra 3Nordson | |
|---|---|---|
| OEM | KLA | Nordson |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | Nordson Quadra 3 |
| Cited variants | — |
|
| Specifications | ||
| Configuration | NIST Traceable[2] | 3 Wire PNE[4] |
| Wafer size | 8 inch[2] | — |
| Traceability | NIST Traceable[2] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[2] | — |
| Category | Metrology & Inspection[3] | Metrology & Inspection[4] |
| Phase | — | 1 Phase[4] |
| Model | — | Quadra 3[5] |
| OEM | — | Nordson / Dage[5] |
| Power | — | 200 - 230v[4] |
| Frequency | — | 50/60 hz[4] |
| X-ray tube | — | QuadraNT Sealed Transmission Tube (0.95 µm feature resolution, 30–160 kV, 10 W max)[6] |
| Detector | — | Aspire FP Flat Panel (1.4 MP, 75 µm pixel pitch, 10 fps, 16-bit digitization)[6] |
| Geometric magnification | — | Up to 2000×[6] |
| Total magnification | — | Up to 7500×[6] |
| Sample stage | — | Dual-axis tilt geometry (±70° tilt per axis, no sample rotation required)[6] |
| Inspection area | — | 510 × 445 mm[6] |
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