Nordson

X-ray inspection tools of this class generate projection images by passing X-rays through a sample and measuring transmitted intensity at a detector. X-ray inspection tools of this class use changes in absorption and geometry to reveal voids, cracks, missing material, bond defects, and other buried features. X-ray inspection tools with tilt or tomographic capability can separate overlapping structures and support volumetric interpretation of internal features.
X-ray inspection systems in electronics manufacturing are typically used after assembly or packaging steps that create buried joints or internal interfaces. X-ray inspection systems in this class commonly sit after attach, interconnect, encapsulation, or module assembly operations and before disposition, rework, or failure analysis.
X-ray inspection systems of this class are used for inspection of hidden solder joints, die attach regions, internal package structure, and other obscured features in electronic assemblies. X-ray inspection systems of this class are also used in failure analysis and process monitoring when engineers need to evaluate internal integrity without destroying the sample.
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Quadra 3 Pro | — | — | Described as a Pro variant with 1.6 MP images on a single curved ultrawide monitor and 0.75 µm feature resolution in the technical specifications. | quiptech.com[4] |
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It is an X-ray equipment model.[1]
The following facts about the Quadra 3 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Quadra 3 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the Quadra 3 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Quadra 3 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Quadra 3 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the Quadra 3 are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 20, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.