Waferpedia

Comparison ledger

.496 PSL WaferversusNewview 7300 Optical

KLA .496 PSL Wafer, Zygo Newview 7300 Optical, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
OEMKLAZygo
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones—2012 Vintage
Control system——
Generation——
FamilyKLA .496 PSL WaferZygo Newview 7300
Specifications
ConfigurationNIST Traceable[1]1X, 5X Objectives[3]
Wafer size8 inch[1]—
TraceabilityNIST Traceable[1]—
Compatible systemsCapable on Surfscan 6xy0 and SP1[1]—
CategoryMetrology & Inspection[2]—
measurement technique—Non-contact, three-dimensional, scanning white light interferometry[5]
scanner—Closed-loop piezo-based, with highly linear capacitive sensors[5]
objectives—1X, 2.5X, 5X, 10X, 20X, 50X, 100X[5]
objective mounting options—Single objective dovetail; manual 6-position turret; motorized 6-position turret[5]
field zoom lenses—0.5X, 0.75X, 1.0X, 1.5X, 2.0X[5]
image zoom—Motorized 3-position system zoom[5]
field of view—0.03 to 14 mm; larger area imaged with field stitching[5]
illuminator—Single white-light LED design[5]
measurement array—Selectable 640x480, 320x240, 160x120; optional 992 x 992 (1K)[5]
focus—Motorized manual and auto focus[5]
z-drive—DC brushless microstepper motor with ballscrew drive, 4 in. range, 0.1 μm resolution[5]
computer—High-performance Dell PC with LCD monitor[5]
software—ZYGO MetroPro software running under Microsoft Windows XP[5]
vertical scan range—150 μm[5]
extended scan range—20 mm[5]
vertical resolution—< 0.1 nm[5]
lateral resolution—0.36 to 9.5 μm[5]
data scan rate—≤135 μm/sec[5]
maximum data points—307,200; 984,064 optional[5]
rms repeatability—< 0.01 nm[5]
step height accuracy—≤ 0.75%[5]
repeatability—≤ 0.1% @ 1σ[5]
test part characteristics—Opaque, transparent, coated, uncoated, specular, and nonspecular surfaces[5]
maximum sample size—3.5 x 8 x 8 in. (89 x 203 x 203 mm); larger sample sizes possible[5]
reflectivity—1-100%[5]
temperature—15 to 30°C[5]
humidity—5 to 95% relative, noncondensing[5]
input voltage—100 to 240 VAC, 50/60 Hz[5]
compressed air—60 to 80 psi; dry and filtered source; 1/4 in. input[5]
stated objectives in inventory listing—1X, 5X objectives[3]
stated scan length in inventory listing—150 µm scan length[3]
stated camera in inventory listing—640 × 480 high-resolution CCD camera[3]
stated image zoom in inventory listing—Automated, motorized 3-position image zoom[3]
stated light source in inventory listing—High-output, long-life white light LED light source[3]
stated software and computer in inventory listing—MetroPro software, Windows XP, and computer[3]
stated stage in inventory listing—Motorized 3-axis stages, XY and Z[4]
stated software in inventory listing—MetroPro 8.3.5 on Dell Windows XP computer[4]
Field of view—0.03 to 14 mm[5]
Control system—MetroPro software on Microsoft Windows XP[3]
Camera—640 × 480 high-resolution CCD camera[3]
Scan length—150 µm[3]
Image zoom—Automated, motorized 3-position image zoom[3]
Light source—High-output, long-life white light LED light source[3]
Head riser—Integrated 75 mm head riser[3]
Stages—Motorized 3-axis stages, XY and Z[4]
Objectives in another configuration—5x and 50x objectives; no turret[4]
MetroPro version—MetroPro 8.3.5[4]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]inventory listing
  4. [4]inventory listing
  5. [5]lambdaphoto.co.uklambdaphoto.co.uk