Comparison ledger
KLA Candela 8620 Surface, KLA Candela 8620 Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 2011– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA Candela 8620 | KLA Candela 8620 |
| Specifications | ||
| Phase | 1 Phase[1] | 1 Phase[3] |
| Configuration | 50/60 Hz[1] | 50/60 Hz[3] |
| OEM | KLA[1] | — |
| Model | Candela 8620[1] | Candela 8620[3] |
| Type | Surface inspection system[1] | — |
| Inspection application | Substrate and epitaxy wafer inspection[2] | — |
| Target manufacturing | High brightness LED manufacturing[2] | — |
| Power | 115 AC[1] | 1 Phase[3] |
| Frequency | 50/60 Hz[1] | 50/60 Hz[3] |
| Current | 12 Amp[1] | — |
| Manufacturer | — | KLA[3] |
| Equipment type | — | Wafer Inspection System[4] |
| Vintage | — | 2011[3] |
| Wafer size | — | 8 inches[5] |
| Condition | — | Used[5] |
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