Comparison ledger
MPI PM100, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | PM100MPI | |
|---|---|---|
| OEM | MPI | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | 6" | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | MPI PM100 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Equipment | MPI TS150 Probe Station[1] | — |
| Use | Electrical testing on wafers or chips[1] | — |
| Terminal capacity | Maximum of 4 independent terminals + additional chuck grounding[1] | — |
| Wafer compatibility | Up to 6 inch wafers[1] | — |
| Probe positioners | MPI PM100 true X,Y,Z micro-positioners[1] | — |
| Probe tips | Interchangeable tungsten (W) contact tips[1] | — |
| Chuck stage | Fine-glide chuck stage on highly stable granite base[1] | — |
| Travel range | 150 mm x 150 mm and 10 mm x 10 mm coarse and fine X-Y travel range[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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