MPI
Plate 01Roland PM100 | V Drums | personal monitor amp | review
Plate 02NEW Roland PM-200 & PM-100 Personal Drum Monitors
Plate 03REVIEW (2026): Roland PM-100 V-Drum Monitor. ESSENTIAL details.
Plate 04Roland PM-100: The Ultimate V-Drum Experience
Plate 05ROLAND PM 100 GEAR REVIEW
Plate 06Roland PM10 v PM100 Quick Sound Test
Wafer size
6"
Power
Electrical testing on wafers or chips[1]
The MPI PM100 is used with interchangeable tungsten contact tips mounted on true X, Y, and Z micro-positioners. The associated probe-station setup uses binocular optics with a digital camera to center the probe tips on contact pads. The associated probe-station setup uses manual micro-manipulators with three-axis movement to make soft and precise mechanical contact on the pads.[1][2]
The associated MPI TS150 setup places the chuck stage on a highly stable granite base and provides 150 mm x 150 mm coarse travel plus 10 mm x 10 mm fine X-Y travel. The associated setup also provides an additional electrical connection to the chuck for conductive substrates.[1][2][3]
The MPI PM100 is used in a setup for electrical testing on wafers or chips, including on-chip probing and wafer probing. The associated MPI TS150 setup is coupled to an Agilent 4155C Semiconductor Parameter Analyzer for DC characterization of devices such as resistance structures, diodes, and transistors. The associated MPI TS150 setup is also coupled to a Zürich Instruments MFIA for AC characterization of the device under test.[1][2]
Documented failure modes, common issues, and field considerations.
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The following facts about the PM100 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the PM100 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the PM100 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the PM100 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the PM100 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the PM100 are on record.
Answerable by: an OEM parts catalog or a service engineer
Last updated Oct 17, 2026.
The KLA Flexus F 2320 I is a stress measurement system for semiconductor wafers that supports 6-inch and 8-inch wafers and uses dual wavelength measurement.
The Signatone S-460 is a 6-inch semi-automatic probe station with automated wafer stepping, motorized theta, and a quick two-point align feature.
The MPI TS150 Probe Station is designed for electrical testing on wafers or chips and supports wafers up to 6 inch.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.