Comparison ledger
Nikon Eclipse L 200, Nikon Eclipse L 200 N Optical, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Eclipse L 200Nikon | |
|---|---|---|
| OEM | Nikon | Nikon |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Nikon Eclipse L 200 | Nikon Eclipse L 200 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | Unable to test, sold As-Is[2] | 16M Pixel Camera[3] |
| OEM | Nikon[2] | — |
| Model | Eclipse L 200[2] | — |
| Tool family | Nikon Eclipse L 200 ND[1] | — |
| Tool type | IC inspection microscope[1] | — |
| Wafer support | 6-inch wafer support[1] | — |
| Camera | — | 16M Pixel[4] |
| Vintage | — | 2016[3] |
| Air Table | — | Not Included[4] |
| Camera Resolution | — | 16 Megapixels[3] |
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