Comparison ledger
Oxford Instruments Ion Beam 300, Tegal 110, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Ion Beam 300Oxford Instruments | 110Tegal |
|---|---|---|
| OEM | Oxford Instruments | Tegal |
| Category | Etch | Etch |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Oxford Instruments Ion Beam | Tegal 110 |
| Cited variants | — |
|
| Specifications | ||
| Configuration | has some PLC errors[2] | — |
| Category | Etch[3] | — |
| Wafer size | 4 inch[2] | — |
| Vintage | 2007[2] | — |
| OEM | Oxford Instruments[2] | — |
| Model | Ion Beam 300[2] | — |
| Tool type | ion beam etch system[3] | — |
| Control/software issue | has some PLC errors[2] | — |
| model | — | 110 SE[1] |
| application focus | — | process development applications[1] |
| process capability | — | deep silicon plasma etching[1] |
| capabilities | — | very high aspect ratio trench etch and profile control[1] |
| configuration | — | multiple configurations with minimum technical intervention[1] |
| System type | — | plasma etch system[4] |
| Supported components | — | MEMS and 3D-IC components[1] |
| Control capability | — | very high aspect ratio trench etch and profile control[4] |
| Physical description | — | compact[1] |
Plan your fab
Building a Etch process? Get a complete equipment list.
Open the fab equipment planner →