Waferpedia

Comparison ledger

03 RR 8120-001-001 Wafer ExchangerversusH-100

Rorze 03 RR 8120-001-001 Wafer Exchanger, Signatone H-100, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
H-100Signatone
OEMRorzeSignatone
CategoryTest & ProbeTest & Probe
Wafer size—three inch square device / substrate chuck
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyRorze 03 RR 8120-001-001 Wafer ExchangerSignatone H-100
Cited variants—
Specifications
Wafer size8 inch[2]—
ManufacturerRorze[2]—
Model03 RR 8120-001-001[2]—
Equipment typeWafer Exchanger[2]—
device/substrate chuck—three inch square[4]
primary applications—probing thick film devices such as ceramic substrates, printed circuit boards and hybrid circuits[4]
series variants—H-100, H-120 and H-150[4]
device stage travel—four inches of X-Y travel[4]
platen motion—linear motion platen that can be raised and lowered using either a crank or a lever[4]
microscope tower—for mounting Stereozoom optics in a fixed position[4]
optional microscope stage—4" x 4" microscope stage[4]
micropositioners—up to six magnetic based micropositioners[4]
probe card adapter—accepts a probe card adapter for use with probe cards[4]
micropositioner electrical connections—six pin jacks that correspond to color coded banana plugs[4]
Platen motion—linear motion platen raised and lowered using either a crank or a lever[4]
Microscope stage option—4" x 4" microscope stage optional[4]
Micropositioners—accepts up to six magnetic based micropositioners[4]
Probe card adapter—includes a probe card adapter for use with probe cards[4]
Electrical connections—six pin jacks corresponding to color coded banana plugs[4]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]Equipment inventory listing
  3. [3]waferpedia.comwaferpedia.com
  4. [4]web.archive.orgweb.archive.org