Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Flex, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | FlexTeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Flex |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | — |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | 26 Slots:[2] |
| Slot 1 | — | BBAC-15 / 811-200-10[2] |
| Slot 2 | — | DC-90 XP / 805-229-61[2] |
| Slot 3 | — | DC-80 / 805-386-01[2] |
| Slot 4 | — | HVD-1 / 805-740-50[2] |
| Slot 5 | — | DC-90 XP / 805-229-61[2] |
| Slot 7 | — | MSB / 805-003-50[2] |
| Slot 9 | — | HSD-200 / 805-251-50[2] |
| Slot 10 | — | DC-90 XP / 805-229-61[2] |
| Slot 11 | — | HSD-200 / 805-251-50[2] |
| Slot 12 | — | DC-90 XP / 805-229-61[2] |
| Slot 13 | — | DC-80 / 805-386-01[2] |
| Slot 14 | — | DC-90 XP / 805-229-61[2] |
| Slot 15 | — | DC-80 / 805-386-01[2] |
| Slot 16 | — | HSD-200 / 805-251-50[2] |
| Slot 17 | — | HVD-1 / 805-740-50[2] |
| Slot 18 | — | POOL2 / 805-016-00[2] |
| Slot 20 | — | SSB / 805-003-11[2] |
| Slot 22 | — | HSD-200 / 805-251-50[2] |
| Slot 25 | — | DC-90 XP / 805-229-61[2] |
| Product line | — | Flex[3] |
| Slot count | — | 26 slots[2] |
| Slot 26 | — | DC-80 / 805-386-01[2] |
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