Flex

The Teradyne Flex is a semiconductor test system. Semiconductor test systems apply electrical stimuli to devices and measure the responses to screen for functional faults and parametric failures before shipment or before later assembly stages.

Semiconductor testers generally connect a device under test to programmable instrument resources through interface hardware. Semiconductor testers generally execute test programs that force voltages, currents, timing patterns, and logic states, then compare measured results against pass and fail limits.

Modular semiconductor test systems generally organize measurement and stimulus resources in card or slot positions. Modular semiconductor test systems generally combine digital channels, power resources, and specialty instruments so a test program can address different pin groups and measurement tasks within one platform.

Semiconductor test systems are used after fabrication has produced electrically testable devices and after packaging or probing has prepared those devices for contact. Semiconductor test systems sit between manufacturing steps and final shipment as a quality screen and data collection point.

A system designated as Test & Probe fits into electrical verification workflows for semiconductor devices. Probe-related use places the equipment around wafer-level contact operations, while tester use places the equipment around packaged-device electrical screening and characterization workflows.

Semiconductor testers are used for production screening, functional verification, and parametric measurement of integrated circuits and related electronic devices. Semiconductor testers are also used to support yield learning, guardband checks, and binning decisions based on electrical behavior.