Manufacturer
LEO
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3 entries
- 1450 VPLEO
The LEO 1450 VPSE is a variable-pressure scanning electron microscope (SEM) platform with mounted EDS microanalysis, a BSE detector system, active isolation, and dedicated control terminals.
CategoryMetrology & Inspection - 1450 VPSELEO
The LEO 1450 VPSE is a variable-pressure scanning electron microscope with mounted EDAX EDS microanalysis, BSE detector system, active isolation, and dedicated control and analytical terminals.
CategoryMetrology & Inspection - 1550LEO
The Zeiss LEO 1550 is a scanning electron microscope listed in the FIB / SEM / EDX / ProSEM section. The Zeiss LEO 1550 is associated with SEM imaging and sample holders for 4 inch wafers, 6 inch wafers, and 6 inch masks.
CategoryMetrology & InspectionWafer4"
