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Leica

RES102

Ion millLeica RES102 family
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RES102 — uwaterloo.ca
Fig. 01RES102uwaterloo.ca[1]

What is it?

The Leica EM RES102 is described as a sample preparation tool for transmission electron microscopy and scanning electron microscopy, used to thin, clean, and polish samples. The source also states that it supports multiple sample holders, integrated applications library, and programmable process parameters.

What can it run?

Process applications and technology nodes documented for this tool.

  • TEM sample preparation
  • SEM sample preparation
  • Thinning samples
  • Cleaning samples
  • Polishing samples
  • Precision micro-milling

What do the numbers mean?

Performance1

Purpose
Sample preparation and precision micro-milling of various solid materials for TEM and SEM[1]
Accurate?

Configuration & options5

Model
EM RES102[1]
Accurate?
Equipment description
Used to thin, clean and polish samples for TEM or SEM imaging[1]
Accurate?
System feature
Multiple sample holders for SEM and TEM sample preparation[1]
Accurate?
System feature
Integrated applications library[1]
Accurate?
System feature
Programmable process parameters[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the RES102 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the RES102 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the RES102 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the RES102 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the RES102 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the RES102 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]uwaterloo.ca — uwaterloo.cauwaterloo.ca
  2. [2]QNC metrology labs | Quantum-Nano Fabrication and Characterization Facility | University of Waterloo — uwaterloo.cauwaterloo.ca
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Last updated Jul 29, 2026.