Wyko

NT-2000

Precision Optics Wyko NT-2000 family

Research Quality: 40% complete

NT-2000 — web.archive.org — Fig. 01NT-2000web.archive.org^[1]

What is it?

The NT-2000 is described as a non-contact surface metrology system that rapidly measures heights from 0.1 nm to several millimeters with vertical resolution as low as 0.1 nm. The fully automated production version includes high-speed autofocus, an auto turret, and a computer-controlled stage, while non-automated versions are available for R&D applications.

What can it run?

Process applications and technology nodes documented for this tool.

process control
R&D investigation
quality inspection
failure analysis
rapid in-line production measurements

What do the numbers mean?

Optics & imaging3

measurement type: non-contact surface metrology / optical profiling^[1]
height measurement range: 0.1 nm to several millimeters^[1]
vertical resolution: as low as 0.1 nm^[1]

Control & software2

motion/stage features: high speed auto focus, auto turret, and computer-controlled stage^[1]
analysis capability: 3-D surface analysis with powerful analysis software^[1]

Configuration & options1

automation: fully automated production version available; non-automated versions available for R&D^[1]

Interested in this tool?

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What replaced it?

Alternatives

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.

Bruker ContourGT X 3 D Optical Profiler— Same function class: Precision Optics, UnknownCompare in depthsource^[3]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Not publicly documented

The following facts about the NT-2000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NT-2000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NT-2000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NT-2000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NT-2000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NT-2000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report