Waferpedia

Wyko

NT3300

Profiling systemWyko NT3300 family
Research Quality: 30% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

WykoNT3300
No photo available yet
  • Plate 01Veeco Wyko Non-contact Profilometer NT3300 (1 of 2) - training video (Georgia Tech - Microelectronics Research Center)

    gatechmircWatch on YouTube
  • Plate 02Veeco Wyko Non-contact Profilometer NT3300 (2 of 2) - training video (Georgia Tech - Microelectronics Research Center)

    gatechmircWatch on YouTube

What is it?

The available sources identify the Wyko NT3300 as a profiling system used in the NanoLab equipment manual and as a Wyko NT3300 Optical Profiler in historical Veeco product materials. No wafer size, node, or lifecycle dates are explicitly stated in the provided sources.

What can it run?

Process applications and technology nodes documented for this tool.

  • Profiling
  • Optical profiling

What do the numbers mean?

Optics & imaging1

Product name
Wyko NT3300 Optical Profiler[2]
Accurate?

Configuration & options2

Model
NT3300[1]
Accurate?
Equipment name
Wyko NT3300 Profiling System[1]
Accurate?
Interested in this tool?
Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Not publicly documented

The following facts about the NT3300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NT3300 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the NT3300 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the NT3300 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the NT3300 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the NT3300 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]nanolab.berkeley.edunanolab.berkeley.edunanolab.berkeley.edu
  2. [2]web.archive.orgweb.archive.orgweb.archive.org
  3. [3]Capabilitiesnanolab.berkeley.edunanolab.berkeley.edu
Was this page accurate?

Last updated Jul 29, 2026.