Comparison ledger
Accretech AP 3000, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | AP 3000Accretech | |
|---|---|---|
| OEM | Accretech | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | 2022 Vintage | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech AP 3000 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| OS Ver | S8.39.FZ[3] | — |
| Input | AC 208V, Single pulse[3] | — |
| Configuration | 12" Nickel AirCool Chucktop[3] | — |
| Headplate Center Hole Size | 620mm[3] | — |
| Model | AP 3000[3] | JR-A-F4T[4] |
| Make | Accretech / TSK[3] | — |
| OS version | S8.39.FZ[3] | — |
| Input power | AC 208V, single pulse[3] | — |
| Chucktop | 12" Nickel AirCool Chucktop[3] | — |
| Z force stage | Standard Z Force Stage[3] | — |
| Loader | Open Foub Single Loader[3] | — |
| Hot temp controller | Air Cooling Hot Temp Controller (15C~150C)[3] | — |
| OCR | Type 6 OCR (Rear-Face Only)[3] | — |
| Cleaning unit block | Cleaning Unit Block (O), Cleaning Ceramic Plate (X)[3] | — |
| USB port | Present[3] | — |
| Ethernet port | Present[3] | — |
| Auto probe change option | No[3] | — |
| Auto tilt option | No[3] | — |
| Vintage | 2022[3] | — |
| Type | Tri-temp prober[1] | — |
| Tester compatibility | HP93K 12-inch POGO type tester[1] | — |
| Model designation | AP 3000 e[2] | — |
| Equipment type | Automatic wafer prober[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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