Accretech

A wafer prober positions a semiconductor wafer under probe contacts so electrical measurements can be made at the wafer level.
A prober of this class uses a precision stage, wafer handling hardware, alignment optics, and a contact chuck or probe interface to connect the wafer under test to external test instrumentation.
The AP 3000 e is used with an external tester, and it is compatible with an HP93K 12-inch POGO type tester.[2]
The AP 3000 Prober is identified as 2022 vintage.
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The following facts about the AP 3000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
The control-system platform and OS era of the AP 3000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the AP 3000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the AP 3000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the AP 3000 are on record.
Answerable by: an OEM parts catalog or a service engineer
No publicly hosted manuals, SOPs, or datasheets for the AP 3000 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
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Last updated Oct 12, 2026.
The Tenney TPS JR-A-F4T is a junior compact temperature test chamber with a 1.2 cubic foot chamber size and a temperature range of -68°C to +180°C.
The Rorze 03 RR 8120-001-001 is a wafer exchanger for 8-inch wafers.
The KLA 1007 is a wafer prober manufactured by KLA.