Comparison ledger
Advantest V 93000 SOC Series LTH TSL 612, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 SOC Series LTH TSL 612Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 | KLA 1007 |
| Specifications | ||
| Version | LTH[1] | — |
| Configuration | Digital C200e 884ch[1] | — |
| Cooling unit | E2760FA[1] | — |
| W/S | xw8200 (3.6GHz x 2)[2] | — |
| Digital | C200e 884ch[1] | — |
| DPS | GPDPS 24ch[2] | — |
| Analog | N/A[2] | — |
| Vintage | 2004[2] | 01.06.1995[4] |
| Workstation | xw8200 (3.6GHz x 2)[2] | — |
| OEM | Advantest[1] | — |
| Model | V 93000 SOC Series LTH TSL 612[1] | 1007[4] |
| Category | Test & Probe[3] | — |
| Manufacturer | — | KLA[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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