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0010-03254 E ChuckversusSurfscan 6200 Refurbishment Services

Applied Materials 0010-03254 E Chuck, KLA Surfscan 6200 Refurbishment Services, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
0010-03254 E ChuckApplied Materials
OEMApplied MaterialsKLA
Category——
Wafer size——
Process node——
Introduced——
Production run——
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Family—KLA Surfscan 6200
Specifications
Configuration—Refurbishment Only of Client System[1]
Machine type—Wafer surface contamination analysis system and laser particle detector for measuring defect densities on unpatterned wafers[2]
Illumination source—Argon-ion laser at 488 nm[2]
Detection sensitivity—Detection sensitivity down to 0.10 µm[2]
Defect detection capability—Locates, sizes, and counts defects in semiconductor substrate material down to 0.157 um at a 95% capture rate and down to 0.09 um at an 80% capture rate[3]
Scanning method—Laser beam scanning for detecting defect contamination[3]
Data display—Color-coded wafer maps, histograms, and summaries[3]
Substrate diameter—125 mm[3]
Gain range—1 to 8 (gain=1 corresponds to size 63 um or 250 um2; gain=8 corresponds to size 0.12 um or 0.005 um2)[3]
LPD count limit—0 to 99999[3]
Throughput settings—High, medium, normal, low[3]
Detection mechanism—Laser beam illumination, scattered-light collection through an optics system, and photomultiplier tube (PMT) amplification[3]
Refurbishment service scope—Refurbishment only of client system[1]
Refurbishment laser—Solid state laser with 3 year warranty[1]
Refurbishment SBC—New/upgraded SBC replacing the old Trenton SBC[1]
Refurbishment storage—Solid state hard drive and solid state back up hard drive[1]
Refurbishment connectivity—USB 2.0 ready, new USB mouse, new USB keyboard[1]
Refurbishment warranty—1 year parts warranty on system[1]
Refurbishment lead time—12 to 16 weeks (depending on production schedule)[1]
Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu