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Surfscan 6200 Refurbishment Services

KLA Surfscan 6200 family
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The KLA Surfscan 6200 is a wafer surface contamination analysis system and laser particle detector used for measuring defect densities on unpatterned wafers, with an argon-ion laser illumination at 488 nm and detection sensitivity down to 0.10 µm. The Surfscan 6200 locates, sizes, and counts defects in semiconductor substrate material down to 0.157 um at a 95% capture rate and down to 0.09 um at an 80% capture rate. Surfscan 6200 Refurbishment Services are offered for a client system refurbishment package that includes a solid state laser and several upgraded components.[1][2]

KLASurfscan 6200 Refurbishment Services
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  • Plate 01Video 1 - KLA-Tencor Surfscan 6200 Defect Inspection System (ID# 3744)

    ClassOneEngineeringWatch on YouTube
  • Plate 02KLA-Tencor Surfscan 6200 Defect Inspection System (ID# 4263)

    ClassOneEngineeringWatch on YouTube
  • Plate 03KLA-Tencor Surfscan 6200 Defect Inspection System(ID# 4271)

    ClassOneEngineeringWatch on YouTube
  • Plate 04KLA-Tencor Surfscan 6200 Defect Inspection System (ID# 3757)

    ClassOneEngineeringWatch on YouTube
  • Plate 05KLA-Tencor Surfscan 6200 Defect Inspection System (ID# 4137)

    ClassOneEngineeringWatch on YouTube

Performance

High, medium, normal, low[2]

Optics

Solid State Laser (5 Year Warranty)[3]

What it is

The Surfscan 6200 belongs to the Surfscan family of wafer surface contamination analysis systems and laser particle detectors.[1]

How it works

A Surfscan class instrument scans wafer surfaces with a laser beam and measures scattered light to detect defect contamination. The instrument then presents the results as wafer maps, histograms, and summary data.[2][4]

The instrument scans wafers held in a cassette and can load cassettes on the left indexer, the right indexer, or both indexers. The instrument uses recipe settings to control scan behavior, defect or haze selection, and display output.[2][4]

The instrument collects defects and haze data by illuminating the wafer surface with a laser beam, collecting scattered light through an optics system, and amplifying the scattered light with a photomultiplier tube.[2][4]

Where it fits in the process flow

The Surfscan 6200 fits in metrology and inspection before downstream process steps that depend on wafer surface cleanliness and defect control. The instrument supports inspection of unpatterned wafers and coating surfaces.[1][5]

Applications

The Surfscan 6200 is used for measuring defect densities on unpatterned wafers. The instrument is also used for detecting defect contamination on semiconductor substrate material.[1][2][4]

What do the numbers mean?

Wafer handling4

Machine type
Wafer surface contamination analysis system and laser particle detector for measuring defect densities on unpatterned wafers[1]
Accurate?
Defect detection capability
Locates, sizes, and counts defects in semiconductor substrate material down to 0.157 um at a 95% capture rate and down to 0.09 um at an 80% capture rate[2]
Accurate?
Data display
Color-coded wafer maps, histograms, and summaries[2]
Accurate?
Substrate diameter
125 mm[2]
Accurate?

Optics & imaging5

Solid State Laser (5 Year Warranty)[3]
Accurate?
Illumination source
Argon-ion laser at 488 nm[1]
Accurate?
Scanning method
Laser beam scanning for detecting defect contamination[2]
Accurate?
Detection mechanism
Laser beam illumination, scattered-light collection through an optics system, and photomultiplier tube (PMT) amplification[2]
Accurate?
Refurbishment laser
Solid state laser with 3 year warranty[3]
Accurate?

Performance1

Throughput settings
High, medium, normal, low[2]
Accurate?

Configuration & options18

Refurbishment Only of Client System[3]
Accurate?
New/Upgraded SBC Replacing the old Trenton SBC[3]
Accurate?
Solid State Hard Drive[3]
Accurate?
Solid State Back Up Hard Drive[3]
Accurate?
USB 2.0 Ready[3]
Accurate?
New USB Mouse[3]
Accurate?
New USB Keyboard[3]
Accurate?
1 Year Parts Warranty on System[3]
Accurate?
Lead Time - 12 to 16 Weeks (depending on production schedule)[3]
Accurate?
Detection sensitivity
Detection sensitivity down to 0.10 µm[1]
Accurate?
Gain range
1 to 8 (gain=1 corresponds to size 63 um or 250 um2; gain=8 corresponds to size 0.12 um or 0.005 um2)[2]
Accurate?
LPD count limit
0 to 99999[2]
Accurate?
Refurbishment service scope
Refurbishment only of client system[3]
Accurate?
Refurbishment SBC
New/upgraded SBC replacing the old Trenton SBC[3]
Accurate?
Refurbishment storage
Solid state hard drive and solid state back up hard drive[3]
Accurate?
Refurbishment connectivity
USB 2.0 ready, new USB mouse, new USB keyboard[3]
Accurate?
Refurbishment warranty
1 year parts warranty on system[3]
Accurate?
Refurbishment lead time
12 to 16 weeks (depending on production schedule)[3]
Accurate?
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Not publicly documented

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Frequently asked questions

What measurement principle does the Surfscan 6200 use?

The Surfscan 6200 uses laser beam scanning to detect defect contamination. The instrument collects scattered light through an optics system and amplifies the scattered light with a photomultiplier tube.[2][4]

How are scan results presented?

The Surfscan 6200 displays scan results in color-coded wafer maps, histograms, and summaries. The summary box includes defect counts, size bin counts, mean, standard deviation, area count, scratch count, and haze metrics.[2][4]

Not publicly documented

The following facts about the Surfscan 6200 Refurbishment Services are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Surfscan 6200 Refurbishment Services are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Surfscan 6200 Refurbishment Services are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Surfscan 6200 Refurbishment Services are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Surfscan 6200 Refurbishment Services are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Surfscan 6200 Refurbishment Services is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (5)Every fact above is drawn from these public sources
  1. [1]waferpedia.com — waferpedia.comwaferpedia.com
  2. [2]wiki.nanotech.ucsb.edu — wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu
  3. [3]inventory listing
  4. [4]https://wiki.nanofab.ucsb.edu/w/images/2/27/Surfscan-Surfscan_6200_info.pdf — wiki.nanofab.ucsb.eduwiki.nanofab.ucsb.edu
  5. [5]Defects in Coatings Deposited by Planar Magnetron Sputtering: Measurements with a Tencor Surfscan 6200 — doi.orgdoi.org
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Last updated Oct 13, 2026.

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