Comparison ledger
Electroglas 1034, Electroglas EG 4090, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1034Electroglas | EG 4090Electroglas |
|---|---|---|
| OEM | Electroglas | Electroglas |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas 1034 | Electroglas EG 4090 |
| Cited variants | — | |
| Specifications | ||
| Configuration | — | with Agilent 4071[3] |
| Equipment type | — | PCM Tester[2] |
| Associated wafer size | — | 200 mm[1] |
| Probe family description | — | Thin wafer probers[1] |
| Stated performance focus | — | Fast probing for high throughput of small die[1] |
| Related instrument | — | Agilent 4071[3] |
| Associated tester | — | Agilent 4071[2] |
| Wafer size support | — | 150 mm (6-inch) and 200 mm (8-inch)[4] |
| Input voltage | — | 115VAC[4] |
| Alignment accuracy | — | Micron-level[4] |
| Probing modes | — | Manual, semi-automatic, and fully automatic[4] |
| Cassette loader | — | Yes[4] |
| Display control module | — | DCM II or DCM-2[4] |
| Prober control module | — | Yes[4] |
| Vision module | — | PRM-3[4] |
| Power | — | 115VAC[4] |
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