Electroglas
EG 4090
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
General reference — not yet source-verifiedA wafer prober is test-floor equipment that brings probes into temporary electrical contact with pads on a semiconductor wafer so measurements can be made before singulation. Wafer probers are used between front-end wafer fabrication and final assembly to evaluate device behavior at wafer level.
How it works
General reference — not yet source-verifiedWafer probers generally use automated handling to move wafers from carriers to a chuck, then use precision stage motion and optical alignment to place each test site under a probe interface. Wafer probers generally work in combination with external electrical test instrumentation that applies signals and records measurements while the prober steps across the wafer.
Where it fits in the process flow
The Electroglas EG 4090 is used for wafer probing in semiconductor manufacturing. The Electroglas 4090 series is used in wafer-level test environments for wafer probing, parametric test, wafer sort, and automated test cell operation.[2][6]
Applications
General reference — not yet source-verifiedWafer probers are used for electrical characterization, process monitoring, and sort decisions on completed wafers before separation into individual chips. Wafer probers can support engineering evaluation as well as routine production testing when a process flow requires electrical contact at the wafer stage.
What do the numbers mean?
Power & electrical1
Wafer handling4
Performance2
Control & software2
Configuration & options7
- with Agilent 4071[1]
Vintage & configurations
Documented models & variants
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Accretech UF 3000 EX Automatic Wafer— Same function class: Test & Probe, nullCompare in depthsource[3]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Input voltage115VAC[4]
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
- Electroglas EG 4090 Spare PartsIn Productionsource[5]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
How does a wafer prober align the wafer?General reference — not yet source-verified
A wafer prober uses alignment marks on the wafer, typically crosses or other fiducials, along with an optical system (microscope and camera) to find those marks. Pattern recognition software computes the offset and corrects the wafer's position through precise motion of the chuck in X, Y, and theta.
Can a wafer prober handle different wafer sizes?General reference — not yet source-verified
While specific models are designed for certain wafer diameters, the class of wafer probers generally includes configurations that accommodate common wafer sizes used in semiconductor manufacturing. Adaptable chucks and handling mechanisms allow for changeover between sizes within a machine's design range.
What are common maintenance tasks for wafer probers?General reference — not yet source-verified
Common maintenance tasks include cleaning probe tips to remove debris or oxide buildup, checking and replacing probe cards, calibrating alignment optics, and lubricating moving parts. Regular calibration of the chuck's motion and alignment accuracy is also necessary to maintain test yield.
Not publicly documented
The following facts about the EG 4090 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the EG 4090 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the EG 4090 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the EG 4090 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the EG 4090 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the EG 4090 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]web.archive.org — electroglas.com (Oct 28, 2021)web.archive.org
- [4]waferpedia.comwaferpedia.com
- [5]Equipment inventory listing
- [6]Refurbished Electroglas EG 4090 / 4090X / 4090u+ 200mm Wafer Prober | SemiStar — semistarcorp.comsemistarcorp.com
Last updated Oct 21, 2026.
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