Comparison ledger
Electroglas EG 4090, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 4090Electroglas | 1007KLA |
|---|---|---|
| OEM | Electroglas | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 4090 | KLA 1007 |
| Cited variants | — | |
| Specifications | ||
| Configuration | with Agilent 4071[3] | — |
| Equipment type | PCM Tester[2] | Prober[6] |
| Associated wafer size | 200 mm[1] | — |
| Probe family description | Thin wafer probers[1] | — |
| Stated performance focus | Fast probing for high throughput of small die[1] | — |
| Related instrument | Agilent 4071[3] | — |
| Associated tester | Agilent 4071[2] | — |
| Wafer size support | 150 mm (6-inch) and 200 mm (8-inch)[4] | — |
| Input voltage | 115VAC[4] | — |
| Alignment accuracy | Micron-level[4] | — |
| Probing modes | Manual, semi-automatic, and fully automatic[4] | — |
| Cassette loader | Yes[4] | — |
| Display control module | DCM II or DCM-2[4] | — |
| Prober control module | Yes[4] | — |
| Vision module | PRM-3[4] | — |
| Power | 115VAC[4] | — |
| Manufacturer | — | KLA[5] |
| Model | — | 1007[5] |
| Description | — | Wafer Prober[5] |
| Wafer size | — | 150 mm[5] |
| Convertible to 8 inch wafer size | — | Yes[5] |
| Vintage | — | 01.06.1995[5] |
| Make | — | KLA[6] |
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