Comparison ledger
Filmetrics F50 and Filmetrics R50, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | F50Filmetrics | R50Filmetrics |
|---|---|---|
| OEM | Filmetrics | Filmetrics |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | 150mm | 200mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Filmetrics F50 | Filmetrics R50 |
| Cited variants | — | |
| Specifications | ||
| Manufacturer | Filmetrics[2] | — |
| Model | F50-UV[2] | — |
| Tool Type | Inspection, Test and Characterization[2] | — |
| Description | Thin-Film Reflectometry[2] | — |
| Reflection spectrum range | 190-1100 nm[2] | — |
| Light sources | Deuterium (UV) and Halogen (Vis-nIR)[2] | — |
| Thickness / optical constants range | 10 Å to 150 µm thickness, n, and k measurements[2] | — |
| Wafer mapping size | Motorized mapping on wafers up to 150 mm[2] | — |
| Small substrate size | ≥ 2-3 mm[2] | — |
| Measurement spot size | Approx. 1-2 mm[2] | — |
| Measurement capability | Can model up to three layers with accuracy[2] | — |
| Measurement modes | Motorized wafer-mapping or non-motorized single-spot measurements[2] | — |
| Maximum sample size | Samples as large as 300 mm in diameter[1] | — |
| Stage type | Motorized R-Theta stage[1] | — |
| Mapping speed | As quickly as two points per second[1] | — |
| Computer interface | USB port connection to a Windows computer[1] | — |
| Default configuration | — | configured by default for metallic layers[3] |
| Default sample thickness | — | 525 um +/- 25 um[3] |
| Equipment section | — | Metrology[3] |
| Related equipment on same page group | — | AIT CMT-SR2000N 4-Point Probe Measurement System; MPI TS150 Probe Station[3] |
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