Comparison ledger
KLA 0035235-003 MMD Head, Nikon L 200 N, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | L 200 NNikon | |
|---|---|---|
| OEM | KLA | Nikon |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | w/ TH 200 Wafer Loader |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 0035235-003 MMD Head | Nikon L 200 N |
| Cited variants | — | |
| Specifications | ||
| Configuration | TSTD PCB ASSY, MMD MEAS HEAD[2] | — |
| Model | 0035235-003[2] | L 200 N[3] |
| Make | KLA[2] | Nikon[3] |
| Part Description | TSTD PCB ASSY, MMD MEAS HEAD[2] | — |
| Compatible System | KLA AIT-XP[2] | — |
| Wafer size | — | w/ TH 200 Wafer Loader[3] |
| OEM | — | Nikon[3] |
| Equipment type | — | Microscope[3] |
| Wafer loader | — | TH 200 Wafer Loader[3] |
| Inspection use | — | Inspection of integrated circuits, flat panel displays, large scale integration electronic devices, wafers, and other substrates[1] |
| Inspection type | — | Exceptional precise optical inspection[1] |
| Integrated loader | — | TH 200 Wafer Loader[3] |
| Loader integration | — | NWL200 wafer loader[1] |
| Supported applications | — | Inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices, wafers, reticules, and other substrates[1] |
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