Comparison ledger
KLA 1007, Multitest MT 9038, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | MT 9038Multitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest MT 9038 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | MT 9038[3] |
| Description | Wafer Prober[1] | Hot test handler[5] |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | Multitest[3] |
| Equipment type | Prober[2] | Handler[3] |
| Configuration | — | AMB only In / Output for SO150/ 1.27[3] |
| Category | — | Test & Probe[5] |
| Contact unit | — | VIP Kelvin contact unit[5] |
| Test capability | — | SO8 HD test[5] |
| In / Output | — | SO150/ 1.27[3] |
| Test mode | — | Hot test handler[4] |
| Test application | — | SO8 HD Test[4] |
| Capacity | — | 53k/day[4] |
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