Comparison ledger
KLA 1007, Veeco FPP 5000 Four Point, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | FPP 5000 Four PointVeeco |
|---|---|---|
| OEM | KLA | Veeco |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Veeco FPP 5000 Four Point |
| Specifications | ||
| Manufacturer | KLA[1] | Veeco[3] |
| Model | 1007[1] | FPP 5000 Four Point[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | Test & Probe[4] |
| Configuration | — | With various types of holders[3] |
| Tool description | — | four point probe with various types of holders[4] |
| Test unit designation | — | VEECO FPP-5000 4-Point Probe test unit[5] |
| Measured items | — | resistive properties of semiconductor wafers and resistive films[6] |
| Measurement modes | — | V/I, SHEET, SLICE, THICK, TYPE, PEN[5] |
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